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Finite Element Analysis of Integrated Circuit Interconnect Lines on Lossy Silicon Substrate

S. Musa[1], M. Sadiku[1], and A. Emam[2]

[1]Roy G. Perry College of Engineering, Prairie View A&M University, Prairie View, TX
[2]Information Systems Department, King Saud University, Riyadh, Saudi Arabia

The silicon substrate has a significant effect on the inductance parameter of a lossy interconnect line on an integrated circuit. It is essential to ...

Simulation Based Approach to Fluorescence Diffuse Optical Tomography

R. Singh, and I. Jose
BITS Pilani Goa Campus
Goa, India

Diffuse Optical Tomography (DOT) uses Near Infra-red (NIR) light to monitor physiological changes in internal organs. NIR light being less energetic in ...

Zero Dispersion Modeling in As2S3-Based Microstructured Fibers

P. Gagnon[1], H. Manouzi[1], M. El Amraoui[1], Y. Messaddeq[1]
[1]Laval University, Quebec City, QC, Canada

An important step in designing a microstructured optical fiber is the computation and management of its dispersion curve. It is well-known that ...

Modeling of a Nonlinear Hybrid Plasmonic Waveguide for Enhanced Surface Plasmon Polaritons Through Optical Parametric Amplification

D. Wang[1], T. Li[1], S. Wang[1], S. Zhu[1]
[1]Nanjing University, Nanjing, Jiangsu, China

Surface Plasmon Polaritions (SPPs), as electromagnetic waves localized at the surface of a metal, enjoy the unique properties to confine energy into ...

Evaluation of Internal Resistance and Power Loss in Micro Thermoelectric Generators (µTEGs)

S. Seif[1], K. Cadien[1]
[1]Department of Chemical & Materials Engineering, University of Alberta, Edmonton, AB, Canada

One of the major challenges in designing µTEGs is to minimize power loss due to internal resistance (r) of Thermoelectric (TE) materials. To solve this ...

Void Shape Evolution of Silicon: Level-Set Approach - new

C. Grau Turuelo[1], C. Breitkopf[1]
[1]Technische Universität Dresden, Dresden, Germany

The void shape evolution of silicon is a process driven mainly by surface diffusion which leads to a geometrical transformation of trenches etched in ...

Electromagnetic Analysis of an Optical Measuring Device Installed in a Transmission Line - new

C. Soares[1], N. Padoin[1], A. C. Zimmermann[1], G. Cunha[2], P. B. Uliana[2], M. Wendhausen[2]
[1]Federal University of Santa Catarina, Florianópolis, SC, Brazil
[2]PowerOpticks Technology Ltda, Florianópolis, SC, Brazil

In this study, COMSOL Multiphysics® software was applied to the investigation of the electromagnetic behavior of an optical crystal submitted to the ...

Tunable Fano-Resonance in Terahertz Metamaterials

B. R. Sangala[1], H. Surdi[1], P. Deshmukh[1], A. V. Gopal[1], S. S. Prabhu[1], G. Rana[2]
[1]Tata Institute of Fundamental Research, Mumbai, Maharashtra, India
[2]Indian Institute of Technology Bombay, Mumbai, Maharashtra, India

Terahertz radiation (THz) is defined to have frequencies from 0.1-10 THz (1 THz=1e12 Hz). This radiation lies between microwave and infrared radiations ...

AlGaInAs/InP Hexagonal Resonator Microlasers with a Center Hole

H. Weng [1], Y. Yang [1], B. Liu [1], X. Ma [1]
[1] Institute of Semiconductors, Chinese Academy of Science, Beijing, China

In the past decades, equilateral polygonal microcavity lasers with whispering-gallery modes (WGMs) have attracted great attentions due to their ...

Measuring the Spectra of Metamaterials at an Oblique Incidence

X. Ni[1,2], Z. Liu[1,2], and A.V. Kildishev[1,2]
[1]School of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana, USA
[2]Birck Nanotechnology Center, Purdue University, West Lafayette, Indiana, USA

The emergence of electromagnetic metamaterials has given rise to a variety of fascinating applications, including the perfect lens and the optical ...