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Secondary Electron Trajectories in Scanning Tunneling Microscopy

H. Cabrera [1], D. A. Zanin [1], L. G. De Pietro [1], A. Vindigni [1], U. Ramsperger [1], D. Pescia [1],
[1] Laboratory for Solid State Physics, Microstructure Research, ETH Zurich, Zurich, Switzerland
发布日期 2016

The recently developed technique Scanning Tunneling Microscopy in the Field Emission regime (STM FE) is based on the Russell Young's topografiner technology. The set-up is a no contacting device consisting of a sharp tip approached vertically to a conducting surface at variable distances and biased with a small voltage with respect to the surface. The system builds a junction across which electrons can be transferred from the tip apex to the surface by direct quantum mechanical tunneling if the distance is in the sub nanometer region.

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