论文和技术资料

R. Wislati[1] and H. Haase[1]
[1]Institut für Grundlagen der Elektrotechnik und Messtechnik, Leibniz Universität Hannover, Hannover, Germany

S.M. Musa[1], M.N.O. Sadiku[1], J.D. Oliver[1]
[1]Prairie View A&M University, Prairie View, TX, USA

M. Bachmann[1], V. Avilov[1], A. Gumenyuk[1], M. Rethmeier[1]
[1]BAM Federal Institute for Materials Research and Testing, Berlin, Germany

Ted Sjöberg¹, Gustav Häggström¹, Mattias Gärdsback², Stefan Marth^1
1Swerim
²Alleima

Zoya Eremenko^1
1Leibniz Institute for Solid State and Materials Research, Dresden, Germany.

S. Soua[1], A. Raude[1], and T-H. Gan[1]
[1]NDT Technology Group, TWI Ltd, Cambridge, United Kingdom

H. Neubert[1], R. Disselnkötter[2], and T. Bödrich[1]
[1]Technische Universität Dresden, Institute of Electromechanical and Electronic Design, Dresden, Germany
[2]ABB AG, Forschungszentrum Deutschland, Ladenburg, Germany

M. W. Kennedy, S. Akhtar, J. A. Bakken, and R. E. Aune
Norwegian University of Science and Technology (NTNU)
Trondheim, Norway

L. Cheng[1], A. Mohimi[1], M. Kogia[1], V. Kappatos[1], C. Selcuk[1], T.-H. Gan[1]
[1]Brunel Innovation Centre, Brunel University, Uxbridge, UK

Florian Fernand Hartmann¹, Dara Bayat², Silvan Stettler¹, Ivan Prieto², Hamed Sattari², Guillermo Villaneuva^1
1EPFL
²CSEM