论文和技术资料

C. Rémi, M. Bergeron, and S. Moreau
Cemagref
Antony, France

T. D. Bui[1], F. Bremerkamp[2], and M. Nowottnick[2]
[1]Department of Automobile Engineering, Thanh Do University, Ha Noi, Vietnam
[2]Institute of Electronic Appliances and Circuits, Department “Reliability and Safety of Electronic Systems”, University of Rostock, Rostock, Germany

D. Mishra [1], Shalivahan [1], A. Banerjee [1],
[1] Indian School of Mines Dhanbad, India

J. Golebiowski[1], S. Milcarz[1]
[1] Department of Semiconductor and Optoelectronics Devices, Technical University of Lodz, Lodz, Poland

杜鸣心 [1], 段雁超 [1], 朱犇 [1],
[1] 西安爱邦电磁技术有限责任公司

R. R. Gidde [1], P. M. Pawar [1],
[1] SVERI's College of Engineering, Pandharpur, Maharashtra, India

M. Rivero[1], O. Andreev[2], A. Thess[3], S. Cuevas[4], T. Fröhlich[1]
[1]Institute of Process Measurement and Sensor Technology, Ilmenau University of Technology, Ilmenau, Germany
[2]Helmholtz-Zentrum Dresden-Rossendorf e. V., Institut für Sicherheitsforschung Abteilung Magnetohydrodynamik, Dresden, Germany
[3]Institute of Thermodynamics and Fluid Mechanics, Ilmenau University of Technology, Ilmenau, Germany
[4]Instituto de Energías Renovables, Universidad Nacional Autónoma de México, Temixco, Morelos, México

A.H. Hegab[1], J.P. Kaerst[1]
[1]HAWK, University of Applied Sciences and Arts, Goettingen, Germany

J. Zhang[1], Z. Wang[1], J. Chen[1]
[1]College of Optoelectronic Science and Engineering, National University of Defense Technology, Changsha, Hunan, China

V. Vidyaa[1]
[1]Jawahar Engineering College, Affliated to Anna University, Chennai, Tamil Nadu, India