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Simulation of the Destruction Effects in CMOS-Devices caused by Impact of Fast Transient Electromagnetic Pulses

M. Rohe, S. Korte, and M. Koch
Institute for the Basics of Electrical Engineering and Measurement Science, Leibniz Universität Hannover, Germany
发布日期 2008

In this paper will be presented how an electronic system and its components will respond in case of an impact of an external electromagnetic pulse (EMP). In the first instance the coupling process of transient electromagnetic pulses into electronic systems will be shown. Out of that the disturbing signal inside the system, which is necessary for the following simulation, will be described analytically.  The theory of the multiphysics  simulation, which connects the heat transfer and electrostatics modules, will be discussed in detail.

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