CF4/O2 等离子体反应器全局模型(用于硅刻蚀)

Application ID: 140901


In this example, the etching of silicon in a CF4/O2 plasma reactor is studied using a global model. Parametric sweeps for ion energy and oxygen mole fraction are computed.

案例中展示的此类问题通常可通过以下产品建模: